Title of article
Testing: Itʹs not just pass/fail anymore
Author/Authors
Scott Davidson، نويسنده , , Sun Microsystems، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
1
From page
80
To page
80
Journal title
IEEE Design and Test of Computers
Serial Year
2005
Journal title
IEEE Design and Test of Computers
Record number
431557
Link To Document