Title of article
Dealing with Early Life Failures
Author/Authors
Kwang-Ting (Tim) Cheng، نويسنده , , University of California، نويسنده , , Santa Barbara، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
1
From page
85
To page
85
Abstract
D&T editor in chief Tim Cheng discusses the industryʹs struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.
Journal title
IEEE Design and Test of Computers
Serial Year
2006
Journal title
IEEE Design and Test of Computers
Record number
431643
Link To Document