Title of article
Guest Editorʹs Introduction: Evolving Methods for Detecting and Handling Reliability Defects
Author/Authors
Phil Nigh، نويسنده , , IBM Microelectronics، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
2
From page
86
To page
87
Abstract
Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.
Journal title
IEEE Design and Test of Computers
Serial Year
2006
Journal title
IEEE Design and Test of Computers
Record number
431644
Link To Document