Title of article
The New World of ESL Design
Author/Authors
Kwang-Ting (Tim) Cheng، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
1
From page
333
To page
333
Abstract
This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
Journal title
IEEE Design and Test of Computers
Serial Year
2006
Journal title
IEEE Design and Test of Computers
Record number
431679
Link To Document