• Title of article

    Guest Editorʹs Introduction: ITC Helps Get More Out of Test

  • Author/Authors

    Kenneth M. Butler، نويسنده , , Texas Instruments، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    2
  • From page
    388
  • To page
    389
  • Abstract
    This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2006
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431686

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431686