Title of article
Handling variations and uncertainties
Author/Authors
Tim Cheng، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
1
From page
434
To page
434
Abstract
With increased technology scaling, high variability and low reliability will likely be the main challenges for chip design and testing. This issue discusses some of the key issues for handling increasing variations and uncertainties. Also, D&Tʹs plans for 2007 special themes have been finalized.
Journal title
IEEE Design and Test of Computers
Serial Year
2006
Journal title
IEEE Design and Test of Computers
Record number
431693
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