Title of article
Tackling variability and reliability challenges
Author/Authors
Shekhar Borkar، نويسنده , , Intel، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
1
From page
520
To page
520
Abstract
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
Journal title
IEEE Design and Test of Computers
Serial Year
2006
Journal title
IEEE Design and Test of Computers
Record number
431703
Link To Document