• Title of article

    Guest Editorsʹ Introduction: Progress in Test Compression

  • Author/Authors

    Scott Davidson، نويسنده , , Sun Microsystems Nur A. Touba، نويسنده , , University of Texas at Austin ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    2
  • From page
    112
  • To page
    113
  • Abstract
    This special issue represents a snapshot of the progress in test compression, a key strategy for dealing with rapidly growing test data volume. Test compression involves encoding test data in a compressed form so that less data needs to be transferred, thereby reducing test time and the need for tester memory. A wide variety of test compression techniques have been developed, both for compressing test vectors and compressing output responses. In recent years, several researchers and companies have developed compression methods and products that achieve significant amounts of compression. These new methods have extended the life of legacy ATE and have been synergistic with the need for additional tests to detect the defects arising in nanometer designs. Thus, test compression continues to be a very active area.
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2008
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431812