Title of article
EELS characterization of TiN grown by the DC sputtering technique
Author/Authors
Duarte-Moller، A. نويسنده , , Avalos-Borja، M. نويسنده , , Contreras، O. نويسنده , , Hirata، G. A. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-128
From page
129
To page
0
Abstract
The main characteristics of sectorial toroidal energy analyzer for a new electrostatic electron spectrometer adapted to a standard scanning electron microscope are defined and determined experimentally. These transfer characteristics, i.e. intensity-energy response and transmission functions, energy resolution and coupling constant, are needed for spectrometer calibration, registration and energy correction of measured backscattered electron spectra and microtomographic analysis of multilayered structures. The spectrometer response to a monoenergetic primary electron beam and to a continuous energy distribution is discussed. Detector response functions for energy independent and linear energy dependent detectors are considered. For aperture slits of the spectrometer which allow reasonable electron intensities at the detector an energy resolution of about 2.5% is obtained.
Keywords
TIN , EELS , EXELFS , RDF
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1999
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
48475
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