Title of article
EELS characterization of TiN grown by the DC sputtering technique
Author/Authors
Duarte-Moller، A. نويسنده , , Avalos-Borja، M. نويسنده , , Hirata، G.A. نويسنده , , Contreras، O. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-128
From page
129
To page
0
Abstract
The satellite line profile in the C-VV Auger electron spectroscopy spectrum depends upon how the initial core hole state and the final multiple hole state are created. Even if the numbers of the holes in the satellite states are the same, the Auger electron speclroscopy spectral profiles of the final multiple hole states are different. The localization of the three hole satellite state is discussed.
Keywords
TIN , EELS , EXELFS , RDF
Journal title
MATHEMATICAL METHODS IN THE APPLIED SCIENCES
Serial Year
1999
Journal title
MATHEMATICAL METHODS IN THE APPLIED SCIENCES
Record number
48490
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