• Title of article

    EELS characterization of TiN grown by the DC sputtering technique

  • Author/Authors

    Duarte-Moller، A. نويسنده , , Avalos-Borja، M. نويسنده , , Hirata، G.A. نويسنده , , Contreras، O. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -128
  • From page
    129
  • To page
    0
  • Abstract
    The satellite line profile in the C-VV Auger electron spectroscopy spectrum depends upon how the initial core hole state and the final multiple hole state are created. Even if the numbers of the holes in the satellite states are the same, the Auger electron speclroscopy spectral profiles of the final multiple hole states are different. The localization of the three hole satellite state is discussed.
  • Keywords
    TIN , EELS , EXELFS , RDF
  • Journal title
    MATHEMATICAL METHODS IN THE APPLIED SCIENCES
  • Serial Year
    1999
  • Journal title
    MATHEMATICAL METHODS IN THE APPLIED SCIENCES
  • Record number

    48490