• Title of article

    Automation of a Surface Sampling Probe/Electrospray Mass Spectrometry System

  • Author/Authors

    Berkel، Gary J. Van نويسنده , , Kertesz، Vilmos نويسنده , , Ford، Michael J. نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2005
  • Pages
    -7182
  • From page
    7183
  • To page
    0
  • Abstract
    An image analysis automation concept and the associated software (HandsFree TLC/MS) were developed to control the surface sampling probe-to-surface distance during operation of a surface sampling electrospray system. This automation system enables both "hands-free" formation of the liquid microjunction used to sample material from the surface and hands-free reoptimization of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system. The image analysis concept and the practical implementation of the monitoring and automated adjustment of the sampling probe-to-surface distance (i.e., liquid microjunction thickness) are presented. The added capabilities for the preexisting surface sampling electrospray system afforded through this software control are illustrated by an example of automated scanning of multiple development lanes on a reversed-phase C8 TLC plate and by imaging inked lettering on a paper surface. The post data acquisition processing and data display aspects of the software package are also discussed.
  • Journal title
    Analytical Chemistry
  • Serial Year
    2005
  • Journal title
    Analytical Chemistry
  • Record number

    50615