Feasibility study for the use of gamma- and X-ray spectrometry to determine uranium contamination

The paper demonstrates a simple approach for determing the thickness of a uranium deposit from a single gamma peak in a spectrum. A second peak is needed to determine a concentration profile in the case of migration of uranium into the wall material. The applicability of gamma ray spectrometry is limited to a certain depth. The potential of an active interrogation technique, in which uranium K X-rays are excited with 57Co gamma rays, has been investigated.