• Title of article

    Application of X-ray fluorescence for the analysis of some technological materials

  • Author/Authors

    N.M. Mukhamedshina، نويسنده , , A.A. Mirsagatova، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    8
  • From page
    715
  • To page
    722
  • Abstract
    Various X-ray fluorescence techniques have been developed for the determination of the composition of two- and three-component alloys. It has been found experimentally and confirmed theoretically that in some alloys, the composition can be determined without taking into account the absorption and secondary excitation of analytical characteristic lines, indicating that the contributions of these effects are opposite. X-ray techniques have also been applied to determine the composition of various kinds of technological waste. As a rule, waste contains many so-called “light” elements (Z<19) for which characteristic lines cannot be detected. In these cases, an independent measurement of the quantity of one of these elements is necessary to determine the quantities of the others. In most of the cases, instrumental neutron activation analysis is used for the independent measurement.
  • Keywords
    X-ray fluorescence (XRF) technique , Si(Li) detector , Standardless fundamental parameter mode , Alloy waste
  • Journal title
    Applied Radiation and Isotopes
  • Serial Year
    2005
  • Journal title
    Applied Radiation and Isotopes
  • Record number

    542163