Title of article
Effects of threshold voltage variability on the characteristics of high sensitivity metal-oxide-semiconductor dosimeters
Author/Authors
Gérard Sarrabayrouse، نويسنده , , Stelios Siskos، نويسنده , , Ali Boukabache، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
3
From page
775
To page
777
Abstract
The consequence of the variability of the threshold voltage of high sensitivity metal-oxide-semiconductor (MOS) dosimeters on the accuracy of the measured dose is presented.
Keywords
radiation dosimetry , Electronic dosimeter , Mos dosimeter
Journal title
Applied Radiation and Isotopes
Serial Year
2005
Journal title
Applied Radiation and Isotopes
Record number
547848
Link To Document