Modelling studies of amorphous In–Se films

The wide-angle X-ray scattering studies on amorphous In–Se films with selenium content of 60 and 66 at.% are reported. The intensities were recorded in the scattering vector range between 0.3 and 16 A01. The intensity functions have been simulated using the Debye relationship for a series of models based on structures of crystalline counterparts. The best agreement with the experimental data has been achieved for the In–Se structure, in which In and Se are tetrahedrally and three-fold coordinated, respectively.