• Title of article

    A low-power 256-Mb SDRAM with an on-chip thermometer and biased reference line sensing scheme

  • Author/Authors

    Kim، Jung Pill نويسنده , , Yang، Woodward نويسنده , , Tan، Han-Yuan نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -328
  • From page
    329
  • To page
    0
  • Abstract
    In order to achieve small self-refresh current (ICC/sub 6/), the first 256-Mb SDRAM with an on-chip thermometer in the DRAM industry is implemented with a new self-refresh scheme. In addition, the biased reference line (BRL) sensing scheme improving refresh characteristics is proposed to increase refresh period and reduce ICC/sub 6/. The on-chip thermometer is characterized by a small area of 0.43 mm/sup 2/, low power consumption with less than 1-/spl mu/A average current, and good accuracy of 5.85/spl deg/C in the worst case. Good accuracy is achieved by incorporating many generic design techniques, including offset-free operational amplifiers and the chopping method, and small area is achieved by applying DRAM cell technology to integrating analog-digital converter. A 75% reduction in ICC/sub 6/ at 60/spl deg/C is achieved with on-chip thermometer and BRL sensing scheme improving 30% of refresh characteristic.
  • Keywords
    TiNi film , transformation , Oriented martensite , Self-accommodating martensite
  • Journal title
    IEEE Journal of Solid- State Circuits
  • Serial Year
    2003
  • Journal title
    IEEE Journal of Solid- State Circuits
  • Record number

    62869