The Application of Computational Electromagnetics to Microwave Dielectric Gauging

Gauging of dielectrics -the accurate evaluation of material properties and geometrical dimensional measurement are discussed first, followed by application of computational electromagnetic methods including FEM, FDTD and TLM for the simulation and evaluation of properties as well as for the design of devices and testing configurations. Microwave microscopy is used for testing in dielectrics in an open antenna configuration. This is followed by modelling and application of closed and open resonant structures for material properties determination and finally an open resonant structure for accurate determination of rubber thickness in an industrial sensor is described. The use of computational electromagnetic tools is seen as indispensable for the design of these testing geometries.