• Title of article

    Bayesian outlier analysis in binary regression

  • Author/Authors

    Aparecida D.P. Souza & Helio S. Migon، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    14
  • From page
    1355
  • To page
    1368
  • Abstract
    We propose alternative approaches to analyze residuals in binary regression models based on random effect components. Our preferred model does not depend upon any tuning parameter, being completely automatic. Although the focus is mainly on accommodation of outliers, the proposed methodology is also able to detect them. Our approach consists of evaluating the posterior distribution of random effects included in the linear predictor. The evaluation of the posterior distributions of interest involves cumbersome integration, which is easily dealt with through stochastic simulation methods.We also discuss different specifications of prior distributions for the random effects. The potential of these strategies is compared in a real data set. The main finding is that the inclusion of extra variability accommodates the outliers, improving the adjustment of the model substantially, besides correctly indicating the possible outliers.
  • Keywords
    binary regression models , Bayesian residual , Mixture of normals , random effect , MarkovChain Monte Carlo
  • Journal title
    JOURNAL OF APPLIED STATISTICS
  • Serial Year
    2010
  • Journal title
    JOURNAL OF APPLIED STATISTICS
  • Record number

    712464