• Title of article

    Interframe intensity correlation matrix for self-calibration in phase-shifting interferometry

  • Author/Authors

    Yun، Hae Young نويسنده , , Hong، Chung Ki نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -485
  • From page
    486
  • To page
    0
  • Abstract
    A new method of estimating reference phase shifts in phase-shifting interferometry is proposed. The reference phase shifts are determined from a matrix that represents the interframe intensity correlation (IIC) of phase-shifted interferograms. The root-mean-square error of intensity measurement is automatically obtained from the smallest eigenvalue of the IIC matrix. The proposed method requires only four interferograms, unlike others, and can extract phase shifts reliably even from interferograms without well-defined fringes, such as speckle patterns. In typical conditions, reference phase shifts and wave-front phases can be determined with an accuracy of lambda/6310 and lambda/150, respectively. The validity of the method is tested by comparing it with other methods in experiments and simulations.
  • Keywords
    gratings , diffraction , instrumentation , phase shift , Measurement , Metrology , Fringe analysis , Phase measurement , Interferometry , Speckle interferometry
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    74583