Title of article
Interframe intensity correlation matrix for self-calibration in phase-shifting interferometry
Author/Authors
Yun، Hae Young نويسنده , , Hong، Chung Ki نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
-485
From page
486
To page
0
Abstract
A new method of estimating reference phase shifts in phase-shifting interferometry is proposed. The reference phase shifts are determined from a matrix that represents the interframe intensity correlation (IIC) of phase-shifted interferograms. The root-mean-square error of intensity measurement is automatically obtained from the smallest eigenvalue of the IIC matrix. The proposed method requires only four interferograms, unlike others, and can extract phase shifts reliably even from interferograms without well-defined fringes, such as speckle patterns. In typical conditions, reference phase shifts and wave-front phases can be determined with an accuracy of lambda/6310 and lambda/150, respectively. The validity of the method is tested by comparing it with other methods in experiments and simulations.
Keywords
gratings , diffraction , instrumentation , phase shift , Measurement , Metrology , Fringe analysis , Phase measurement , Interferometry , Speckle interferometry
Journal title
Applied Optics
Serial Year
2005
Journal title
Applied Optics
Record number
74583
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