• Title of article

    Synthetic Aperture Interferometry: In-Process Measurement of Aspheric Optics

  • Author/Authors

    Petzing، Jon نويسنده , , Tomlinson، Richard نويسنده , , Coupland، Jeremy M. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -700
  • From page
    701
  • To page
    0
  • Abstract
    A scanning probe consisting of a source and receive fiber pair is used to measure the phase difference between wave fronts scattered from the front and rear surfaces of an aspheric optic. This system can be thought of as a classical interferometer with an aperture synthesized from the data collected along the path of the probe. If the form of either surface is known, the other can be deduced. In contrast with classical interferometers, the method does not need test or null plates and has the potential to be integrated into the manufacturing process. [Optical Society of America ]
  • Keywords
    instrumentation , Measurement , Metrology , Radiometry , Spectroscopy , spectroscopic instrumentation , Ultraviolet , Spectrometers
  • Journal title
    Applied Optics
  • Serial Year
    2003
  • Journal title
    Applied Optics
  • Record number

    74593