• Title of article

    Fundamental spatial resolution of an x-ray pore optic

  • Author/Authors

    Mieremet، Arjan L. نويسنده , , Beijersbergen، Marco W. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -7097
  • From page
    7098
  • To page
    0
  • Abstract
    We investigate the fundamental spatial resolution of an x-ray pore optic as a function of the pore dimensions, the photon energy, and the focal length. We achieve this by calculating the shape of the focal spot, using diffraction integrals such that the half-energy width is determined. Quantitative results are presented for the XRay Evolving Universe Spectroscopy (XEUS) telescope, showing that a resolution of better than 2 arc sec half-energy width is possible by use of an optic with pore sizes of approximately 0.5 mm.
  • Keywords
    statistical optics , Speckle , instrumentation , Measurement , Metrology , Surface measurements , Roughness , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , COHERENCE
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    74921