• Title of article

    Modeling total and polarized reflectances of ice clouds: evaluation by means of POLDER and ATSR-2 measurements

  • Author/Authors

    Stammes، Piet نويسنده , , Knap، Wouter H. نويسنده , , C.-Labonnote، Laurent نويسنده , , Brogniez، Gerard نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -405
  • From page
    406
  • To page
    0
  • Abstract
    Four ice-crystal models are tested by use of ice-cloud reflectances derived from Along Track Scanning Radiometer-2 (ATSR-2) and Polarization and Directionality of Earthʹs Reflectances (POLDER) radiance measurements. The analysis is based on dual-view ATSR-2 total reflectances of tropical cirrus and POLDER global-scale total and polarized reflectances of ice clouds at as many as 14 viewing directions. Adequate simulations of ATSR2 total reflectances at 0.865 (mu)m are obtained with model clouds consisting of moderately distorted imperfect hexagonal monocrystals (IMPs). The optically thickest clouds (tau > ~16) in the selected case tend to be better simulated by use of pure hexagonal monocrystals (PHMs). POLDER total reflectances at 0.670 (mu)m are best simulated with columnar or platelike IMPs or columnar inhomogeneous hexagonal monocrystals (IHMs). Lessfavorable simulations are obtained for platelike IHMs and polycrystals (POLYs). Inadequate simulations of POLDER total and polarized reflectances are obtained for model clouds consisting of PHMs. Better simulations of the POLDER polarized reflectances at 0.865 (mu)m are obtained with IMPs, IHMs, or POLYs, although POLYs produce polarized reflectances that are systematically lower than most of the measurements. The best simulations of the polarized reflectance for the ice-crystal models assumed in this study are obtained for model clouds consisting of columnar IMPs or IHMs.
  • Keywords
    Aerosol and cloud effects , Atmospheric , Ice crystal phenomena , Remote sensing , Atmospheric scattering , scattering , ocean optics
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    76089