Method for Measuring the Refractive Index and the Thickness of Transparent Plates with a Lateral-Shear, Wavelength-Scanning Interferometer

A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed. The method is based on a simple, variable lateral-shear, wavelength-scanning interferometer. To achieve highly accurate measurements of both refractive index n and thickness d we use several means to determine these two quantities. We finely tune a distributed-feedback diode laser light source to introduce a phase shift into the detected signal, whereas we make the sample rotate to produce variable lateral shearing. Phase shifting permits precise determination of the optical thickness, nd , whereas refractive index n is obtained from the retrieved phase of the overall interference signal for all incidence angles.