Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition

Thick YBa2Cu3O7−x (YBCO) films with high critical current density (Jc) values were deposited by pulsed-laser deposition (PLD) on Hastelloy with a textured CeO2/Gd2Zr2O7 buffer layer. Both cross-sectional and plan-view TEM specimens of the YBCO films were prepared, and then the nanostructural characterization of the films was performed by transmission electron microscopy (TEM). The YBCO films less than 1 μm thick were predominantly composed of c-axis-oriented grains, however, many a-axis-oriented grains, which grew larger with the increase of the thickness of the YBCO film, were formed beyond about 1 μm from the CeO2 interface. We found Y2O3 and copper oxides between a- and c-axes-oriented grains. In particular, Y2O3 grains were formed between the {001} plane of an a-axis-oriented grain and the {100} or {010} plane of a c-axis-oriented grain. The orientation relationships between Y2O3 and YBCO are found to be; (001)YBCO//(001)Y2O3 and (100)YBCO//(110)Y2O3. In addition, we also found gaps between YBCO grains. Since a-axis-oriented grain growth and the formation of Y2O3, copper oxides and the gaps are considered to reduce the Jc values of the YBCO film, it is important to determine the optimum process conditions to suppress the nucleation of a-axis-oriented grains, impurity oxides and gaps. C 2006 Springer Science + Business Media, Inc.