Title of article
Physical properties of low-k films based on the co-condensation of methyltrimethoxysilane with a bridged silsesquioxane
Author/Authors
B. R. Kim، نويسنده , , J. W. Kang، نويسنده , , K. Y. Lee، نويسنده , , J. M. Son، نويسنده , , M. J. Ko، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
12
From page
4591
To page
4602
Abstract
Though spin-on organosilicates are considered
as the promising candidates of low dielectric
constant materials, it is necessary for a successful
integration to improve mechanical strength such as
modulus and fracture toughness. In this study, five sets
of MTMS–BTMSE copolymers were synthesized and
characterized while the monomer content of BTMSE
(bis(trimethoxysilyl)ethane) was varied from 9.1 to
47.3 mol% vs. MTMS (methyltrimethoxysilane). In
parallel with the measurement of dielectric constant,
four different tests were carried out to evaluate
mechanical properties of the MTMS–BTMSE copolymers.
Modulus was measured by the nanoindentation
technique and the modified edge lift-off test (MELT)
was employed to extract adhesive fracture toughness
quantitatively. In addition, residual stress was calculated
by sensing the change in radius of curvature of
the substrate. The chemical structure of the copolymers
was also analyzed with FTIR and NMR. Network
formation was enhanced as the amount of BTMSE
increased, which led to improvement of modulus and
the increase in refractive index and dielectric constant.
However, an increasing rate of fracture toughness by
the MELT was not proportional to the increase in the
amount of BTMSE, which implied that it was necessary
to optimize the composition of the copolymers since
adhesion strength was conjectured the most critical
factor for a successful integration.
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
832943
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