Title of article
Mechanical properties of electrodeposited nanocrystalline copper using tensile and shear punch tests
Author/Authors
Ramesh Kumar Guduru، نويسنده , , Kristopher A. Darling، نويسنده , , Ronald O. Scattergood، نويسنده , , Carl C. Koch، نويسنده , , K. L. Murty، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
8
From page
5581
To page
5588
Abstract
Characterization of the mechanical properties
of electrodeposited nanocrystalline Cu with an average
grain size of 74 nm was carried out using two different
testing techniques, shear punch tests and tensile tests. The
grain size distribution was broad and the volume fraction of
larger grains was appreciable. The electrodeposited Cu had
a high yield strength combined with moderate ductility and
strain hardening. Scatter in the ductility values was
attributed to residual porosity and inhomogeneity in the
microstructure. Measurements of the strain rate sensitivity
showed a significant increase in the rate sensitivity and a
decrease in the activation volume for the deformation of
nanocrystalline Cu compared with similar tests on coarsegrained
cold worked Cu
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
833078
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