• Title of article

    Mechanical properties of electrodeposited nanocrystalline copper using tensile and shear punch tests

  • Author/Authors

    Ramesh Kumar Guduru، نويسنده , , Kristopher A. Darling، نويسنده , , Ronald O. Scattergood، نويسنده , , Carl C. Koch، نويسنده , , K. L. Murty، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2007
  • Pages
    8
  • From page
    5581
  • To page
    5588
  • Abstract
    Characterization of the mechanical properties of electrodeposited nanocrystalline Cu with an average grain size of 74 nm was carried out using two different testing techniques, shear punch tests and tensile tests. The grain size distribution was broad and the volume fraction of larger grains was appreciable. The electrodeposited Cu had a high yield strength combined with moderate ductility and strain hardening. Scatter in the ductility values was attributed to residual porosity and inhomogeneity in the microstructure. Measurements of the strain rate sensitivity showed a significant increase in the rate sensitivity and a decrease in the activation volume for the deformation of nanocrystalline Cu compared with similar tests on coarsegrained cold worked Cu
  • Journal title
    Journal of Materials Science
  • Serial Year
    2007
  • Journal title
    Journal of Materials Science
  • Record number

    833078