Title of article
X-ray diffraction and compositional studies of AgInS2 thin films obtained by spray pyrolysis
Author/Authors
M. Calixto-Rodriguez، نويسنده , , A. Tiburcio-Silver، نويسنده , , A. Sanchez-Juarez، نويسنده , , M. E. Calixto، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2008
Pages
5
From page
6848
To page
6852
Abstract
Silver indium sulfide (AgInS2) thin films have
been prepared by the spray pyrolysis technique using silver
acetate, indium acetate, and N,N-dimethylthiourea as precursor
compounds. Depending on the film preparation
conditions, AgInS2 thin films are obtained which could be
candidates to be used in photovoltaic devices. X-ray diffraction
(XRD) and energy dispersive spectroscopy (EDS)
compositional studies were done on films formed at different
substrate temperatures (Ts) and Ag:In:S ratios in the
starting solutions. When Ag:In:S ratios are 1:1:1, 1:0.25:2,
and 1:1:2, XRD patterns of the thin films indicated that the
crystallographic structure is mainly chalcopyrite AgInS2.
An additional phase, acanthite Ag2S, appeared when the
depositions where done at low Ts. EDS analysis showed
that AgInS2 films near stoichiometric composition were
obtained by using an atomic ratio of Ag:In:S = 1:1:2 in the
starting solution and Ts = 400 C.
Journal title
Journal of Materials Science
Serial Year
2008
Journal title
Journal of Materials Science
Record number
834724
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