Title of article
Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm technology node
Author/Authors
V.، Ferlet-Cavrois, نويسنده , , P.، Roche, نويسنده , , G.، Gasiot, نويسنده , , K.، Forbes, نويسنده , , V.، OSullivan, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-2045
From page
2046
To page
0
Abstract
This paper presents experimental ASER on SOI and BULK SRAMs for the 250-, 130-, and 90-nm technologies. The key parameters controlling soft error rate (SER) in these technologies are modeled with Monte Carlo simulations to predict SER to the 65-nm node.
Keywords
Determination , Continuous , Biodegradable dissolved organic carbon , bioreactor , Cell immobilization
Journal title
IEEE Transactions on Nuclear Science
Serial Year
2003
Journal title
IEEE Transactions on Nuclear Science
Record number
86306
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