Title of article
Enhanced avalanche multiplication factor and single-event burnout
Author/Authors
S.، Kuboyama, نويسنده , , N.، Ikeda, نويسنده , , T.، Hirao, نويسنده , , S.، Matsuda, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-2232
From page
2233
To page
0
Abstract
We describe experimental data for single-event burnout of bipolar junction transistors and the results of analysis using device simulators. The analysis indicates that the enhanced impact ionization rate in the ion track plays an essential role to trigger the burnout.
Keywords
Determination , Biodegradable dissolved organic carbon , Continuous , Cell immobilization , bioreactor
Journal title
IEEE Transactions on Nuclear Science
Serial Year
2003
Journal title
IEEE Transactions on Nuclear Science
Record number
86331
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