Title of article
Liquid surface order: X-ray reflectivity
Author/Authors
P. S. Pershan، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
6
From page
111
To page
116
Abstract
This note contains a brief summary of how the X-ray specular reflectivity technique can be used to measure electron density profiles across the bulk/vapor interface for a variety of liquids.
Journal title
Physica A Statistical Mechanics and its Applications
Serial Year
1996
Journal title
Physica A Statistical Mechanics and its Applications
Record number
864183
Link To Document