Title of article
High-frequency, at-speed scan testing
Author/Authors
Lin، Xijiiang نويسنده , , R.، Press, نويسنده , , J.، Rajski, نويسنده , , P.، Reuter, نويسنده , , T.، Rinderknecht, نويسنده , , B.، Swanson, نويسنده , , N.، Tamarapalli, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-16
From page
17
To page
0
Abstract
The authors describe new strategies where at-speed scan tests can be applied with internal PLL. They present techniques for optimizing ATPG across multiple clock domains and methodologies to combine both stuck-at-fault and delay-test vectors into an effective test suite.
Keywords
leukemia
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90293
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