• Title of article

    Nonlinear parametric test

  • Author/Authors

    C.R.N.، Teani, نويسنده , , A.M.، Jorge, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -202
  • From page
    203
  • To page
    0
  • Abstract
    Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An opamp parametric test, using the proposed methodology, is presented.
  • Keywords
    leukemia
  • Journal title
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
  • Serial Year
    2003
  • Journal title
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
  • Record number

    91450