Title of article
Nonlinear parametric test
Author/Authors
C.R.N.، Teani, نويسنده , , A.M.، Jorge, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-202
From page
203
To page
0
Abstract
Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An opamp parametric test, using the proposed methodology, is presented.
Keywords
leukemia
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Serial Year
2003
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Record number
91450
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