An expert system framework for a CIM based quality inspection system

With todayʹs competitive marketplace moving toward a goal of lean, error free manufacturing a need for technological change in quality decision making has arisen. One approach to this new “quality” standard involves tying quality analysis to the theory of Computer Integrated Manufacturing (CIM). In this paper a model of such a system is presented including the application of an expert system to enhance dimensional tolerancing and data analysis in quality control. Our expert system will also serve a dual role as a technological link to a CIM environment through the use of IGES computer aided design data.