Title of article
Minimizing total weighted tardiness on a single batch process machine with incompatible job families
Author/Authors
Imelda C. Perez، نويسنده , , John W. Fowler، نويسنده , , W. Matthew Carlyle، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2005
Pages
15
From page
327
To page
341
Abstract
The diffusion step in semiconductor wafer fabrication is very time consuming, compared to other steps in the process, and performance in this area has a significant impact on overall factory performance. Diffusion furnaces are able to process multiple lots of similar wafers at a time, and are therefore appropriately modeled as batch processing machines with incompatible job families. Due to the importance of on-time delivery in semiconductor manufacturing, we focus on minimizing the total weighted tardiness in this environment. The resulting problem is NP-Hard, and we decompose it into two sequential decision problems: assigning lots to batches followed by sequencing the batches. We develop several heuristics for these subproblems and test their performance.
Journal title
Computers and Operations Research
Serial Year
2005
Journal title
Computers and Operations Research
Record number
928170
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