• Title of article

    High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior

  • Author/Authors

    T.، Ogura, نويسنده , , H.، Ohashi, نويسنده , , W.، Saito, نويسنده , , Y.، Takada, نويسنده , , M.، Kuraguchi, نويسنده , , K.، Tsuda, نويسنده , , I.، Omura, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -2527
  • From page
    2528
  • To page
    0
  • Abstract
    AlGaN-GaN power high-electron mobility transistors (HEMTs) with 600-V breakdown voltage are fabricated and demonstrated as switching power devices for motor drive and power supply applications. The fabricated power HEMT realized the high breakdown voltage by optimized field plate technique and the low on-state resistance of 3.3 m(omega)cm/sup 2/, which is 20 times lower than that or silicon MOSFETs, thanks to the high critical field of GaN material and the high mobility in 2DEG channel. The fabricated devices also demonstrated the high current density switching of 850 A/cm/sup 2/ turn-off. These results show that AlGaN-GaN power-HEMTs are one of the most promising candidates for future switching power device for power electronics applications.
  • Keywords
    OBESITY , Genotype , Energy
  • Journal title
    IEEE TRANSACTIONS ON ELECTRON DEVICES
  • Serial Year
    2003
  • Journal title
    IEEE TRANSACTIONS ON ELECTRON DEVICES
  • Record number

    95854