• Title of article

    Growth of ZnSe thin films by radical assisted MOCVD method

  • Author/Authors

    T. Aoki، نويسنده , , M. Morita and A. Hiraya، نويسنده , , S. Wickramanayaka، نويسنده , , Y. Nakanishi، نويسنده , , Y. Hatanaka، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1996
  • Pages
    6
  • From page
    132
  • To page
    137
  • Abstract
    ZnSe epitaxial films were grown by the low pressure metal organic chemical vapor deposition (MOCVD) technique using diethylzinc and selenium hydride as the source materials. When H radicals generated by a rf glow discharge are introduced into the reaction site, the growth rate of the ZnSe film was increased by a factor of 10. The reactivity between source materials and H radicals was investigated for different pressures, substrate temperatures as well as for different concentrations of H radicals and source materials. With the assistance of H radicals, epitaxial growth of ZnSe films on Si substrates was realized at substrate temperatures above 400°C. If the plasma is produced by N2 gas, ZnSe films could be obtained similar to that of the H2 plasma environment. This method is seen to be a promising technique in doping nitrogen into ZnSe in producing p-ZnSe films.
  • Journal title
    Applied Surface Science
  • Serial Year
    1996
  • Journal title
    Applied Surface Science
  • Record number

    990328