Title of article
XPS, AES and LEED studies of Cu deposited on Cr2O3(0001) surfaces
Author/Authors
Qinlin Guo، نويسنده , , Linlin Gui، نويسنده , , Preben J. M?ller، نويسنده , , Karina Binau، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
6
From page
513
To page
518
Abstract
The interaction between ultrathin layers of Cu and Cr2O3(0001) surfaces was studied by X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy and low-energy electron diffraction (LEED). The XPS results indicate that copper deposited on the Cr2O3(0001) surfaces is initially in a Cu(I) state, and an agglomeration of copper on the Cr2O3(001)-1 × 1 surface was seen with increasing copper coverage. A Cu(111)R30°Cr2O3(0001)-1 × 1 epitaxial relationship was observed by LEED.
Journal title
Applied Surface Science
Serial Year
1996
Journal title
Applied Surface Science
Record number
990399
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