Title of article
In-situ reflectivity measurements during pulsed-laser deposition of Bi2Sr2CaCu2O8+δ
Author/Authors
Alfons Ritzer، نويسنده , , B. Falkner، نويسنده , , S.T. Li، نويسنده , , D. B?uerle، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
5
From page
721
To page
725
Abstract
Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi2Sr2CaCu2O8+δ films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few lattice constants reflectivity is shown to be sensitive to changes in deposition temperature near the decomposition limit.
Journal title
Applied Surface Science
Serial Year
1996
Journal title
Applied Surface Science
Record number
990665
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