Surface structure analysis of dispersed metal sites on single crystal metal oxides by means of polarization-dependent total-reflection fluorescent EXAFS

We have developed the polarization-dependent total-reflection fluorescence extended X-ray absorption fine structure (PTRF-EXAFS) method which can provide information about the orientation and anisotropic structures of dispersed metal sites on a support by employing parallel or perpendicular polarization of synchrotron radiation. In this paper we have reviewed our recent results concerning Pt cluster on α-Al2O3(0001) and Mo oxides on TiO2(110). We also discuss the advantage and disadvantage of the PTRF-EXAFS technique.