Reconstruction of the {111} face on a tungsten tip observed by means of a scanning field emission microscope (SFEM)

The paper describes a simple procedure of a preparation of tungsten tip for an application to ultra high vacuum scanning tunnelling microscope (UHV STM). Scanning field emission microscope was used as a testing method. A microtip with one atom on its apex was obtained by a reconstruction of the {111} face. The reconstruction is caused by annealing in the presence of a high electric field as well as by annealing without the field.