Title of article
Be-chalcogenides: heteroepitaxy and interface properties
Author/Authors
M.Th. Litz، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
6
From page
429
To page
434
Abstract
We report on the molecular beam epitaxy and the properties of Be-chalcogenides. Especially the interface between ZnSe and BeTe and BeTe/ZnSe superlattices have been studied by means of HRXRD (high resolution X-ray diffraction), HRTEM (high resolution transmission-electron-microscopy), RHEED (reflection-high-energy-electron-diffraction), photo-electron-spectroscopy (PES) and photo-luminescence (PL). A strong dependence of the structural and electronic properties of these superlattices (SL) on the interface configuration has been found. A high valence band offset of about 1 eV between BeTe and ZnSe has been determined by means of photo-luminescence and photo-electron-spectroscopy.
Keywords
Band alignment , Lattice relaxation , ZnSe/BeTe , Epitaxy , Superlattice , Interface
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992241
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