Title of article
The deposition of TiO2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy
Author/Authors
Zhongdang Xiao، نويسنده , , Jianhua Gu، نويسنده , , Dan Huang، نويسنده , , Zuhong Lu، نويسنده , , Yu Wei، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
8
From page
85
To page
92
Abstract
The deposition of TiO2 films on silanized industrial glass surfaces was investigated by XPS. The results show that mercaptopropyltrimethoxysilane was self-assembled on the industrial glass surface and the terminal groups (-SH) were nearer to the air/silane interface than the silicon atoms. Longer treatment of SAMs with hydrogen peroxide in acetic acid can make the conversion of the terminal groups in the top-most layer into desirable sulfonate groups complete. TiO2 thin films are successfully absorbed on self-assembly monolayers and titanium oxide with different oxidation states may exist in the thin films as-deposited on the surface of the self-assembly monolayers.
Keywords
XPS , Self-assembly monolayers , TiO2 thin films
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992315
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