• Title of article

    The deposition of TiO2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy

  • Author/Authors

    Zhongdang Xiao، نويسنده , , Jianhua Gu، نويسنده , , Dan Huang، نويسنده , , Zuhong Lu، نويسنده , , Yu Wei، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    8
  • From page
    85
  • To page
    92
  • Abstract
    The deposition of TiO2 films on silanized industrial glass surfaces was investigated by XPS. The results show that mercaptopropyltrimethoxysilane was self-assembled on the industrial glass surface and the terminal groups (-SH) were nearer to the air/silane interface than the silicon atoms. Longer treatment of SAMs with hydrogen peroxide in acetic acid can make the conversion of the terminal groups in the top-most layer into desirable sulfonate groups complete. TiO2 thin films are successfully absorbed on self-assembly monolayers and titanium oxide with different oxidation states may exist in the thin films as-deposited on the surface of the self-assembly monolayers.
  • Keywords
    XPS , Self-assembly monolayers , TiO2 thin films
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992315