• Title of article

    Time resolved detection of particle removal from dielectrics on femtosecond laser ablation

  • Author/Authors

    A. Rosenfeld )، نويسنده , , D. Ashkenasi، نويسنده , , Vincent H. Varel، نويسنده , , M. Wa¨hmer، نويسنده , , E.E.B. Campbell، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    5
  • From page
    76
  • To page
    80
  • Abstract
    The dynamics of the ablation process in different oxides amorphous and crystalline quartz, sapphire and MgO.after intensive laser excitation was studied by a combination of the femtosecond pump–probe technique with optical surface scattering. A 120-fs laser pulse ls800 nm.was focused onto the sample with a fluence at least twice the single-shot surface damage threshold. A much weaker probe laser pulse optically aligned collinear to the pump beam illuminated the excited area at variable delay times up to 100 ps. We observe a material dependent increase in the scattering signal after a certain delay time which we interpret as the onset of the ablation process. This occurs much earlier for amorphous and crystalline silica than for sapphire or MgO, as a consequence of differences in the electron–phonon coupling strength. The morphology of the irradiated spot on sapphire, amorphous and crystalline quartz is indicative of melting and vaporisation in contrast to that on MgO which clearly shows fracturing. q1998 Elsevier Science B.V.
  • Keywords
    ablation , dielectrics , Time resolved detection
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992405