Title of article
Time resolved detection of particle removal from dielectrics on femtosecond laser ablation
Author/Authors
A. Rosenfeld )، نويسنده , , D. Ashkenasi، نويسنده , , Vincent H. Varel، نويسنده , , M. Wa¨hmer، نويسنده , , E.E.B. Campbell، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
5
From page
76
To page
80
Abstract
The dynamics of the ablation process in different oxides amorphous and crystalline quartz, sapphire and MgO.after
intensive laser excitation was studied by a combination of the femtosecond pump–probe technique with optical surface
scattering. A 120-fs laser pulse ls800 nm.was focused onto the sample with a fluence at least twice the single-shot
surface damage threshold. A much weaker probe laser pulse optically aligned collinear to the pump beam illuminated the
excited area at variable delay times up to 100 ps. We observe a material dependent increase in the scattering signal after a
certain delay time which we interpret as the onset of the ablation process. This occurs much earlier for amorphous and
crystalline silica than for sapphire or MgO, as a consequence of differences in the electron–phonon coupling strength. The
morphology of the irradiated spot on sapphire, amorphous and crystalline quartz is indicative of melting and vaporisation in
contrast to that on MgO which clearly shows fracturing. q1998 Elsevier Science B.V.
Keywords
ablation , dielectrics , Time resolved detection
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992405
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