• Title of article

    Cd Zn S solid solution thin films, CdS thin films and x 1yx CdSrZnS multilayer thin films grown by SILAR technique

  • Author/Authors

    Mika P. Valkonen، نويسنده , , Seppo Lindroos، نويسنده , , Markku Leskela، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    9
  • From page
    283
  • To page
    291
  • Abstract
    Cd Zn S solid solution thin films were grown by successive ionic layer adsorption and reaction SILAR.technique on x 1yx soda lime glass, ITO-covered glass and polymer substrates. In addition, CdS thin films and CdSrZnS multilayer thin films were deposited on polymer substrates. The thin films were characterized by X-ray diffraction and energy dispersive X-ray analysis. The Cd Zn S films were polycrystalline and cubic 111.or hexagonal 002.oriented. The cationranion ratios x 1yx were 1 : 1. In XRD, the CdSrZnS multilayer samples showed not only reflections of CdS, ZnS, but also Cd Zn S formed x 1yx in the interface. The Cd Zn S thin films and CdSrZnS multilayer thin films could be tailored to a set of various x 1yx composition and structure. q1998 Elsevier Science B.V. All rights reserved
  • Keywords
    semiconductors , SILAR , Thin film , CDS , ZnS
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992797