Title of article
In situ characterization of surfaces at high temperature by using simultaneously a pyroreflectometer and an X-ray diffractometer
Author/Authors
G. Llauro، نويسنده , , D. Hernandez، نويسنده , , F. Sibieude، نويسنده , , J.M. Gineste، نويسنده , , R. Verges، نويسنده , , D. Antoine، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
6
From page
91
To page
96
Abstract
An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in situ the thermoradiative properties and the temperature of the sample simultaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO2−x plates and CVD (Ti, Si, N) coatings were chosen as illustrating examples.
Keywords
High temperature oxidation , Optical fiber pyroreflectometer , X-ray diffraction
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992810
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