Title of article
Surface plasmon excitations in the wake of hollow atom relaxation at surfaces
Author/Authors
J. Mrogenda، نويسنده , , J. Ducree، نويسنده , , E. Reckels، نويسنده , , J. Leuker، نويسنده , , H.J. Andr?، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
11
From page
269
To page
279
Abstract
We report on distinct peaks arising on the low-energy side of KLL Auger spectra which are observed during the interaction of slow highly charged ions at Al(111) and Si(100) surfaces under grazing observation. The energy offset of these structures, with respect to the dominant spectral feature, corresponds to an energy loss of electrons escaping the bulk which can uniquely be connected to surface plasmon excitations. Describing the bulk interaction of outgoing electrons within the framework of a scattering model, we estimate the electron bulk penetration length following a subsurface K-Auger decay. For high impact energies, we also provide experimental evidence for the ionization of target core levels by these outgoing electrons.
Keywords
Plasmon excitation , Hollow atom relaxation , Surface
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992879
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