Title of article
Non-contact atomic force microscopy imaging of TiO 100/ 2 surfaces
Author/Authors
Syed H. Raza، نويسنده , , C.L. Pang، نويسنده , , S.A. Haycock، نويسنده , , G. Fraser and G. Thornton، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
271
To page
275
Abstract
Atomically resolved non-contact fm mode atomic force microscopy images have been obtained from TiO2 100.surfaces.
The 1=1 surface is observed, as well as the 1=3 phase previously imaged with STM. The morphology of the latter
reconstruction consists of 110. microfacets. An additional reconstruction with 1=3 symmetry is observed, which is
assigned to a phase intermediate between the 1=1 and 1=3-microfacet terminations. q1999 Elsevier Science B.V. All
rights reserved.
Keywords
Surface structure , NC-AFM , TiO2 100.
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995183
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