• Title of article

    Calculation of the frequency shift in dynamic force microscopy

  • Author/Authors

    H. Ho¨lscher )، نويسنده , , U.D. Schwarz، نويسنده , , A. Kubetzka and R. Wiesendanger، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    8
  • From page
    344
  • To page
    351
  • Abstract
    A theoretical study of the quality and the range of validity of different numerical and analytical methods to calculate the frequency shift in dynamic force microscopy is presented. By comparison with exact results obtained by the numerical solution of the equation of motion, it is demonstrated that the commonly used interpretation of the frequency shift as a measure for the force gradient of the tip–sample interaction force is only valid for very small oscillation amplitudes and leads to misinterpretations in most practical cases. Perturbation theory, however, allows the derivation of useful analytic approximations. q1999 Elsevier Science B.V. All rights reserved
  • Keywords
    Frequency shift , atomic force microscopy , Tip–sample interaction , Dynamic force microscopy , Frequency modulation force microscopy , Oscillating cantilever
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995196