• Title of article

    Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy

  • Author/Authors

    M.P. Seah، نويسنده , , I.S. Gilmore، نويسنده , , S.J. Spencer، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    5
  • From page
    132
  • To page
    136
  • Abstract
    Both predictable and unpredictable non-linearities occur in the electron counting systems which provide the intensity scales of different X-ray photoelectron spectrometers. The predictable effects are inherent in good system design and may be accurately corrected as they are both stable and repeatable. Unpredictable effects occur due to inadequate design, deterioration in service or poor setting-up procedures. We have therefore, devised a method to measure this non-linearity in X-ray photoelectron spectroscopy XPS.. A widescan survey.spectrum is recorded from a copper or stainless steel sample at both high and low X-ray source emission currents. The ratio of these spectra, at each emission energy, allows non-linearities to be easily measured. We show results for one example of a predictable system exhibiting only dead time effects which can be corrected to give 1% accuracy up to 5 Mcrs. We also show results for an unpredictable multichannel detector system where the non-linearity exceeds 5% at counting rates below 20 kcrs and reaches 50% at 500 kcrs. Crown Copyright q1999 Published by Elsevier Science B.V.
  • Keywords
    Linearity , Quantification , XPS , Intensity linearity , detectors
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995447