Comparative AES studies of grain boundary diffusion in thin polycrystalline AgrPd, AurPd and CurPd films

An analysis of the measurements of grain boundary diffusion in the AgrPd, AurPd and CurPd couples in the temperature range of 393–573 K was performed. Two methods were independently used for determination of the grain boundary diffusion coefficients andror activation energies of grain boundary diffusion: the so-called first appearance method and the simplified surface accumulation method. Auger electron spectroscopy AES.was used as a measurement technique for the determination of diffusion-induced concentration changes of the diffusing species. Diffusion data obtained by using two different methods have been analysed and compared. q1999 Elsevier Science B.V. All rights reserved